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dc.contributor.authorDelimitis, Andreas
dc.contributor.authorHansen, Vidar
dc.contributor.authorGjønnes, Jon
dc.date.accessioned2020-02-03T09:49:38Z
dc.date.available2020-02-03T09:49:38Z
dc.date.created2019-05-01T21:01:24Z
dc.date.issued2019-02
dc.identifier.citationDelimitis, A., Hansen, V., Gjønnes, J. (2019) Geometry determination and refinement in the rotation electron diffraction technique. Ultramicroscopy, 201, pp. 68-76.nb_NO
dc.identifier.issn0304-3991
dc.identifier.urihttp://hdl.handle.net/11250/2639214
dc.description.abstractThe necessary parameters (rotation axis, incident electron beam direction and beam tilt path) in order to describe the diffraction geometry in the Rotation Electron Diffraction (RED) method during data collection are determined and refined. These parameters are prerequisites for the subsequent calculations of excitation errors, sg, for zero (ZOLZ) or higher order Laue zones (HOLZ) reflections. Comparison with simulated results, for a CoP3 thermoelectric crystal, shows excellent agreement between the two approaches -calculated and simulated. In addition to their determination, a thorough refinement methodology for the incident electron beam direction and beam tilt path has been applied, too, based on Kikuchi lines of HOLZ reflections. Incorporation of the refined excitation error values can be considered both in theoretical calculations for diffracted beam intensities, based on the Bloch wave method, as well as in deducing integrated intensities from experimental rocking curves. The methodology described in this study is quite indispensable, as it forms an essential step for performing dynamical calculations in RED, enabling thus enhanced accuracy in structural parameter clarification. The latter is especially important in the case of thermal factors refinement for e.g. thermoelectrics, which are imperative for material properties’ evaluation.nb_NO
dc.language.isoengnb_NO
dc.publisherElsevier Ltd.nb_NO
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.subjectrotation electron diffractionnb_NO
dc.subjectdynamical diffractionnb_NO
dc.subjectstructure determinationnb_NO
dc.subjectthermoelectric materialsnb_NO
dc.subjectKikuchi linesnb_NO
dc.titleGeometry determination and refinement in the rotation electron diffraction techniquenb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.rights.holder© 2019 The Authorsnb_NO
dc.subject.nsiVDP::Technology: 500::Materials science and engineering: 520nb_NO
dc.source.pagenumber68-76nb_NO
dc.source.volume201nb_NO
dc.source.journalUltramicroscopynb_NO
dc.identifier.doi10.1016/j.ultramic.2019.02.011
dc.identifier.cristin1694971
cristin.unitcode217,8,5,0
cristin.unitnameInstitutt for maskin, bygg og materialteknologi
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
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