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dc.contributor.authorFaza, Ahmad Mohammad Ahmad
dc.contributor.authorLeth, John
dc.contributor.authorEielsen, Arnfinn Aas
dc.date.accessioned2024-05-02T12:07:25Z
dc.date.available2024-05-02T12:07:25Z
dc.date.created2023-10-31T12:51:13Z
dc.date.issued2023
dc.identifier.citationLeth, J., & Eielsen, A. A. (2023, August). Criterion for Sufficiently Large Dither Amplitude to Mitigate Non-linear Glitches. In 2023 IEEE Conference on Control Technology and Applications (CCTA) (pp. 970-977). IEEE.en_US
dc.identifier.isbn979-8-3503-3544-6
dc.identifier.urihttps://hdl.handle.net/11250/3128840
dc.description.abstractA model describing glitch disturbances is introduced and analysed. The model is used to find the response of glitch disturbances when adding a periodic dither to the input and applying low-pass filtering to the output. This averaged response is used to find a criterion to determine a sufficiently large dither amplitude that will make the averaged glitch disturbances appear as a constant on the output of the low-pass filter. An important resulting property is that the averaged response to glitch disturbances is independent of the model input. By fitting the model to the measured response of a common off-the-shelf digital-to-analogue converter, simulations are used to verify the analytical resulen_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.ispartofProceedings of the 2023 IEEE Conference on Control Technology and Applications (CCTA)
dc.titleCriterion for sufficiently large dither amplitude to mitigate non-linear glitchesen_US
dc.typeChapteren_US
dc.description.versionacceptedVersionen_US
dc.rights.holderThe authors / publisheren_US
dc.subject.nsiVDP::Teknologi: 500en_US
dc.source.pagenumber970-977en_US
dc.identifier.doi10.1109/CCTA54093.2023.10253012
dc.identifier.cristin2190507
cristin.ispublishedtrue
cristin.fulltextpostprint


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