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dc.contributor.authorFaza, Ahmad Mohammad Ahmad
dc.contributor.authorLeth, John
dc.contributor.authorEielsen, Arnfinn Aas
dc.date.accessioned2023-11-20T11:27:01Z
dc.date.available2023-11-20T11:27:01Z
dc.date.created2023-10-31T12:32:48Z
dc.date.issued2023
dc.identifier.citationA. Faza, J. Leth and A. A. Eielsen, "Mitigating Non-linear DAC Glitches Using Dither in Closed-loop Nano-positioning Applications," 2023 American Control Conference (ACC), San Diego, CA, USA, 2023, pp. 685-691,en_US
dc.identifier.isbn979-8-3503-2806-6
dc.identifier.issn0743-1619
dc.identifier.urihttps://hdl.handle.net/11250/3103542
dc.description.abstractDigital-to-analog conversion is essential in digital signal processing applications, including closed-loop control schemes. Noise and distortion in digital-to-analog converters result in reduced performance for high-precision mechatronics such as nano-positioning. Glitches are common in practical switched systems such as digital-to-analog converters; observed as an output disturbance. Due to the wide-bandwidth, impulse-like behavior, control law bandwidth is generally too low to provide adequate attenuation; deteriorating open and closed-loop performance. This article demonstrates how large-amplitude high-frequency periodic dither mitigates the effect of glitches in a nano-positioning system under closed-loop control. Simulations are performed using a model that includes significant non-linearities with a response fitted to an off-the-shelf commercial device, as well as using standard linear time-invariant models for other system components fitted to the responses of common, commercially available devices. The results highlight the significance of reconstruction filter design when applying dithering in this setting.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.ispartof2023 American Control Conference (ACC 2023)
dc.relation.ispartofseriesAmerican Control COnference (ACC);
dc.titleMitigating non-linear DAC glitches using dither in closed-loop nano-positioning applicationsen_US
dc.typeChapteren_US
dc.description.versionacceptedVersionen_US
dc.rights.holderAmerican Control Conference (ACC)en_US
dc.subject.nsiVDP::Matematikk og Naturvitenskap: 400::Informasjons- og kommunikasjonsvitenskap: 420en_US
dc.source.pagenumber685-691en_US
dc.identifier.cristin2190476
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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