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dc.contributor.authorWang, Min
dc.date.accessioned2010-09-22T14:36:19Z
dc.date.available2010-09-22T14:36:19Z
dc.date.issued2010
dc.identifier.urihttp://hdl.handle.net/11250/181705
dc.descriptionMaster's thesis in Computer scienceen_US
dc.description.abstractIn 2000, a geologist Fridtjof Riis discovered a meteor crater in Ritland, Hjelmelan municipality in Rogland. This crater was formed by meteorite impact. The crater has areas with a lot of cracks in the rocks, and geologists think these cracks are very valuable information for them. By making photos with an ordinary camera, they want to get binary pictures where the cracks are shown as white lines on a black background. They can measure and quantify the length and direction of the cracks on the binary image. The objective of this project is to extract cracks from the digital photos. In this project, statistical technique – linear regression, and image processing techniques like spatial filtering, morphological operations have been used. Binary images with white lines showing cracks on black background are generated as result of this project. Geologists can use this result to analysis the cracks.en_US
dc.language.isoengen_US
dc.publisherUniversity of Stavanger, Norwayen_US
dc.relation.ispartofseriesMasteroppgave/UIS-TN-IDE/2010;
dc.subjectinformasjonsteknologien_US
dc.subjectdatateknikken_US
dc.subjectRitland crateren_US
dc.subjectrock cracken_US
dc.subjectimage processen_US
dc.subjectlinear regressionen_US
dc.titleDetection and analysis of rock cracks in meteor crateren_US
dc.typeMaster thesisen_US
dc.subject.nsiVDP::Technology: 500::Information and communication technology: 550::Computer technology: 551en_US
dc.source.pagenumber65 p.en_US


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